Grenoble, France, February 3, 2022 – Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices, today...
Caroline Demoerloose
SOT-MRAM To Challenge SRAM
SEMICONDUCTOR ENGINEERING | JANUARY 13TH, 2022 Spin-orbit torque memory adds endurance and faster write speeds, but displacing existing memories is...
Presentation MRAM Forum – IEDM 2021
Latest Emerging Memory Developments At 2021 IEDM And MRAM Forum Including In Memory Computing
FORBES | Tom Coughlin | Dec 27, 2021, This article covers some more interesting content from the 2021 IEEE IEDM and the MRAM Forum that followed the...
IEDM Conference to be held December 11-15, 2021
SEMICON WEST – 2021
HPROBE will be present at SEMICON WEST.
Hprobe Announces New Generation of Magnetic Test Head for Wafer Sort of MRAM in Mass Production
Grenoble, France, November 30, 2021 – Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices, today...
SOT-MRAM Research Overview Challenges and Current Market Trends
Ingenious e-Brain | Dr. Gaurav Santhalia & Riya Dahiya MRAM is becoming more attractive in the industry because of its promising prospects for...
MRAM technologies: from space applications to unified cache memory ?
EE Web | Sebastien Couet | Septembre 22, 2021 Magneto-resistive random access memory (MRAM) is a non-volatile memory technology that relies on the...
Magnetic sensors-A review and recent technologies
IOPSCIENCE | Mohammed Asadullah Khan | 15 June 2021 Abstract Magnetic field sensors are an integral part of many industrial and biomedical...
Emerging Memories Look to Displace NOR, SRAM
EE/TIMES | Gary Hilson| 08.30.2021 3D Xpoint's growth won't be without challenges Emerging memories are poised for another growth surge. That’s...
Breakthrough in high-volume testing for automotive/consumer advanced 3D magnetic sensors
Electronics360| 12 July 2021 Hprobe, a provider of semiconductor automated test equipment for magnetic devices, successfully demonstrated a new 3D...
Accuracy boost for magnetic wafer probe
eeNews Europe | Nick Flaherty | June 22, 2021 The latest magnetic wafer probe design from Hprobe has an accuracy of less than 5µT French test...
Hprobe Announces Breakthrough in High-Volume Testing for Automotive/Consumer Advanced 3D Magnetic Sensors
Grenoble, France, June 15, 2021 – Hprobe, a provider of semiconductor Automated Test Equipment (ATE) for magnetic devices, today announced the...
可在量產中實現良率管理的STT-MRAM磁性測試
CTIMES | 【作者: Siamak Salimy】/ 2021年06月02日 星期三...
Magnetic Testing for STT-MRAM Enabling Yield Management in Volume Manufacturing
CTIMES | By Siamak Salimy | Jun 02, 2021 Because STT-MRAM (Magnetic Random-Access Memory) is fast, non-volatile, durable, low power and scalable, it...
[Future Semiconductor Technology] The Present of the Next-Generation Ultra-Low-Power MRAM Technology
SKhynix NEWSROOM | Dr. Joonyeon Chang | January 14, 2021 With the development of information and communication technology (ICT), the amount of...
Hprobe Receives Order from a Tier-1 Semiconductor Manufacturer for a Wafer-Level Magnetic Tester
SemiconductorDigest | SHANNON DAVIS | April 2021 Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices,...
HPROBE RECEIVES ORDER FROM TIER-1 SEMICONDUCTOR MANUFACTURER FOR WAFER-LEVEL MAGNETIC TESTER
Powerelectronics | Hordon Kim | April 2021 Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices,...
Hprobe Receives Order from a Tier-1 Semiconductor Manufacturer for a Wafer-Level Magnetic Tester to be Used for Strategic R&D of Magnetic Materials and Devices
Grenoble, France, April 27, 2021 – Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices, today announced...