Grenoble, France, December 1, 2022 – Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices, today...
Hprobe Announces Breakthroughs in MRAM Wafer Testing to Support Production Ramp-up
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Press releases
Leading Magnetic ATE Company Hprobe Expands Presence into Korea with Order from Major Semiconductor Manufacturer and Signs with Woowon for Distribution
Grenoble, France, February 3, 2022 – Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices, today...
Hprobe Announces New Generation of Magnetic Test Head for Wafer Sort of MRAM in Mass Production
Grenoble, France, November 30, 2021 – Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices, today...
Hprobe Announces Breakthrough in High-Volume Testing for Automotive/Consumer Advanced 3D Magnetic Sensors
Grenoble, France, June 15, 2021 – Hprobe, a provider of semiconductor Automated Test Equipment (ATE) for magnetic devices, today announced the...
Hprobe Receives Order from a Tier-1 Semiconductor Manufacturer for a Wafer-Level Magnetic Tester to be Used for Strategic R&D of Magnetic Materials and Devices
Grenoble, France, April 27, 2021 – Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices, today announced...
Hprobe, Leader in Magnetic Field Testing Creates Subsidiary in Germany and Receives First Order from Fraunhofer IPMS
Grenoble, France, January 26, 2021 – Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices, today...
Hprobe Announces First Automated Test Equipment Dedicated to 3D Magnetic Sensors for Automotive and Industrial Applications
Grenoble, France, October 1, 2020 – Hprobe, a provider of semiconductor Automated Test Equipment (ATE) for magnetic devices, today announced the...
Hprobe, Leader in Magnetic Field Testing Announces Completion of a New Funding Round with International Investors
Grenoble, France, February 4, 2020 – Hprobe, a provider of semiconductor Automatic Test Equipment (ATE) for magnetic devices, today announced the...
Hprobe and HTSi Sign Sales and Service Agreement for Taiwan and Singapore
Announcement follows new qualification of Hprobe tester in Taiwan by a major semiconductor foundry Taipei, Taiwan, September 17, 2019 – Hprobe, a...
Hprobe to Present Breakthrough Technology for Ultra-Fast Magnetic Testing of MRAM Devices above 2 Tesla
Santa Clara, CA, August 1, 2019 – Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices, will present at...
Hprobe Solving Magnetic Test Challenges of STT and SOT-MRAM Emerging Non-volatile Memories
Grenoble (France), Mars 28, 2019 – Hprobe, a provider of turnkey semiconductor Automatic Test Equipment for magnetic devices based on a patented...